At Mitutoyo RCE, our research is redefining the boundaries of what's possible in nanotechnology and precision engineering. We specialize in developing advanced metrology solutions such as non-contact measurement techniques, laser scanning, and structured light systems. Our work not only enhances quality control systems but also contributes significantly to the progress of Industry 4.0.
Leveraging decades of expertise and Mitutoyo's rich legacy in nanotechnology, we provide innovative, cutting-edge solutions tailored to meet the demands of the most advanced and sophisticated industries.
RCE pioneers non-contact metrology solutions using advanced laser and structured light scanning technologies. These systems provide high-precision measurements without physical contact, ensuring no damage to delicate surfaces. Ideal for complex geometries and challenging environments, our tools deliver fast, reliable data with minimal disruption to the object being measured.
RCE excels in developing advanced algorithms that enhance CMM capabilities, optimizing measurement accuracy and efficiency. Our software integrates seamlessly with high-precision CMMs, enabling advanced data analysis and complex part programming. Designed for precision, it ensures reliable, reproducible results for the most demanding metrology applications.
Providing precision metrology solutions tailored to specific industries to improve manufacturing accuracy, product quality, and innovation. Applications range from automotive calibration and aerospace manufacturing to medical device development and semiconductor fabrication.
